Bruker AXS has introduced the S1 TURBOSD (TM) handheld XRF system as a second-generation Silicon Drift Detector (SDD) based elemental analyser. In June 2008, Bruker announced the world’s first handheld XRF instrument using SDD technology, based on the proprietary Bruker X-Flash® SDD, for extremely rapid alloy analysis with Grade ID in one second, and complete analysis in 2-3 seconds.
Its large area X-Flash SDD maintains outstanding energy resolution even at high count rates, resulting in operation that is 3-5 times faster than traditional handheld XRF units. Importantly, the X-Flash SDD detector technology also allows the measurement of light elements like Mg, Al and Si, without any need for vacuum or helium atmosphere.
The new S1 TURBOSD is designed to be very rugged and easy to use in the field, incorporating numerous further analytical improvements, based on customer feedback. The user interface is very simple, and when operated in Universal Mode requires no user input. The analyser offers true point-and-shoot operation, and requires no set-up by the user. Its unique Universal Mode automatically identifies the type of metal
being measured and selects the best calibration available for the analysis. If desired, advanced users can customise the operation of the analyser and add grade definitions to the analyser.
John Landefeld, Vice President of Bruker AXS Handheld, commented: “The S1 TURBOSD is a continuation of our tradition of technology leadership in handheld XRF instrument design, which is based upon real customer needs and feedback. The S1 TURBOSD X-Flash detector technology establishes Bruker’s technology leadership in handheld XRF instrumentation.”