• World’s Fastest Desktop SEM to Handle Large Samples Announced

Microscopy & Microtechniques

World’s Fastest Desktop SEM to Handle Large Samples Announced

Mar 30 2015

Phenom-World is proud to announce the Phenom XL, an addition to the highly successful Phenom desktop SEM product family. The Phenom XL is the world’s first desktop Scanning Electron Microscope (SEM) that allows full imaging of samples up to 100 mm x 100 mm.

The Phenom XL pushes the boundaries of desktop SEM performance. It features the proven ease-of-use and fast time to image of all the Phenom systems. Additionally, it is equipped with a chamber that despite its small size allows analysis and full imaging of large samples up to 100 mm x 100 mm. And yet, the Phenom XL is a desktop SEM that uses little energy, needs little space, and does not require special facilities.

The Phenom XL features various key innovations that enable this performance: a proprietary venting/loading mechanism that ensures the fastest vent/load cycle in the world. With a time-to-image of less than one minute, it provides the highest throughput. A newly developed compact motorised stage enables the user to scan the full sample area, and yet keep the SEM small enough to fit on a standard table.

The user interface is based on proven technology used in the successful Phenom Pro and ProX desktop SEM’s. This enables both existing and new users to quickly become familiar with the system and get the most of it without the need for significant set-up or training. The ease-of-use is given an extra boost with a newly designed ‘single-shot’ optical navigation camera (NavCam) that allows the user to move to any spot on the sample with just a single click – within seconds.

Elemental analysis can be added by the EDS technology already proven on the Phenom ProX. An optional Secondary Electron Detector (SED) is available for applications that require surface and topography sensitive imaging. 


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