Mass Spectrometry & Spectroscopy

  • Simple and Accurate Silicone Coatweight Analysis 

Simple and Accurate Silicone Coatweight Analysis 

Nov 12 2018 Read 715 Times

The LAB-X5000 Benchtop XRF from Hitachi High-Tech uses automatic atmospheric pressure and temperature compensation to eliminate the need for helium. As well as lowering the cost of analysis, this means there is no need for buying, storing and replacing cumbersome gas bottles. But, this gain wouldn’t mean a great deal unless a high level of performance was maintained.

The automatic compensation means that operators can be sure of outstanding repeatability of their analysis, even when the instrument is used in harsh and demanding environments. To compensate for silicone that may not be evenly distributed over the sample, a sample spinner allows the analysis of a wider area on the sample, delivering more reliable results.

The LAB-X5000 can slot right into release liner operations with no disruption and immediately begin creating value. Once a sample has been prepared using the provided disc cutter and sample holder, the operator simply places it in the analyser, presses the Start button, and results, as well as a simple pass/fail message, is displayed within seconds, allowing to make adjustments to the process fast if needed.

One single calibration is used for a wide variety of paper (for example glassine, clay-coated). All the operator has to do is to measure an uncoated sample when changing type of paper. Hitachi High-Tech is committed to giving companies speed, simplicity and reliability without prohibitive costs, and the LAB-X5000 provides exactly that.

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