Microscopy & Microtechniques

  • University of Leeds Extends Microscopy Capability  with Hitachi’s Next-Generation CFE-SEM
    SU8230 SEM at Leeds University

University of Leeds Extends Microscopy Capability  with Hitachi’s Next-Generation CFE-SEM

Jun 30 2014 Read 8493 Times

The UK’s University of Leeds Electron Microscopy and Spectrocopy Centre (LEMAS), internationally renowned as a leading research centre in microscopic and spectroscopic characterisation, has extended its electron microscopy capability by installing the first of a new generation of high performance cold field emission SEMs.

The Hitachi SU8230 at Leeds is the first SEM in Europe to utilise the latest high stability CFE technology and will be used for nanomaterial characterisation in pharmaceutical, catalysis and energy applications.  Ultra-low voltage capabilities, including low-loss BSE imaging, will provide information on the true-surface and electrical properties of materials at nanoscale resolution.

Being equipped with angle-selective BF and DF STEM, the SU8230 will enable correlative studies with TEM, especially on light element materials. Simultaneous SE, BSE, BF and DF imaging, as well as nanoscale EDX, will also provide additional insights compared to TEM techniques alone. 

The instrument is expected to stimulate nanomaterials research in the region by being made accessible to industry and outside Higher Education institutions whilst underpinning microscopy research at the University of Leeds.

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