Microscopy & Microtechniques
New SEM Provides Ultrahigh Resolution Imaging of Large Samples in their Native State
May 22 2017 Comments 0
Jeol USA introduces a new Scanning Electron Microscope (SEM) that combines the performance of a Field Emission SEM with the simplicity of the Jeol InTouchScope SEM series. The new JSM-IT300HR features exceptional image fidelity at any kV with a high brightness, long life emitter. Offering higher resolution and magnification than ever before in this series, the IT300HR greatly enhances surface topography and contrast.
A rugged in-chamber specimen stage and large chamber accommodate a wide variety of samples of different shapes, sizes, and weights, enabling users to secure large, heavy and odd shaped objects on the stage with clear positioning prior to evacuating the chamber.
The specimen chamber’s twelve geometrically-optimised analytical ports allow for multiple detectors, creating a virtual nano-lab inside the SEM. Low vacuum capability is a standard feature and allows for imaging and analysis of all types of samples in their native state. When configured with a Jeol EDS detector, fast analysis is done directly within the SEM software interface.
InTouchScope™ series SEMs are designed to make operation intuitive, and controlled through touchscreen interface using multi-touch gestures and/or traditional keyboard/mouse and operation panel. A ‘Navi’ mode guides operation from sample introduction to automatic condition setting for new or occasional users.
Do you like or dislike what you have read? Why not post a comment to tell others / the manufacturer and our Editor what you think. To leave comments please complete the form below. Providing the content is approved, your comment will be on screen in less than 24 hours. Leaving comments on product information and articles can assist with future editorial and article content. Post questions, thoughts or simply whether you like the content.
In this Issue Articles - How to Achieve Ultimate PCR Optimisation Spotlight Features - Incubators, Freezers & Cooling Equipment - Balances & Strain Gauges - Proteomics, Genomics & Mic...
View all digital editions
Jan 21 2018 Palm Springs, CA, USA
Jan 24 2018 Cardiff, UK
Jan 29 2018 Dubai International Convention & Exhibition Centre
Feb 03 2018 San Diego, CA USA
Feb 05 2018 Dubai, UAE