Microscopy & Microtechniques
New SEM Provides Ultrahigh Resolution Imaging of Large Samples in their Native State
May 22 2017 Read 1052 Times
Jeol USA introduces a new Scanning Electron Microscope (SEM) that combines the performance of a Field Emission SEM with the simplicity of the Jeol InTouchScope SEM series. The new JSM-IT300HR features exceptional image fidelity at any kV with a high brightness, long life emitter. Offering higher resolution and magnification than ever before in this series, the IT300HR greatly enhances surface topography and contrast.
A rugged in-chamber specimen stage and large chamber accommodate a wide variety of samples of different shapes, sizes, and weights, enabling users to secure large, heavy and odd shaped objects on the stage with clear positioning prior to evacuating the chamber.
The specimen chamber’s twelve geometrically-optimised analytical ports allow for multiple detectors, creating a virtual nano-lab inside the SEM. Low vacuum capability is a standard feature and allows for imaging and analysis of all types of samples in their native state. When configured with a Jeol EDS detector, fast analysis is done directly within the SEM software interface.
InTouchScope™ series SEMs are designed to make operation intuitive, and controlled through touchscreen interface using multi-touch gestures and/or traditional keyboard/mouse and operation panel. A ‘Navi’ mode guides operation from sample introduction to automatic condition setting for new or occasional users.
Do you like or dislike what you have read? Why not post a comment to tell others / the manufacturer and our Editor what you think. To leave comments please complete the form below. Providing the content is approved, your comment will be on screen in less than 24 hours. Leaving comments on product information and articles can assist with future editorial and article content. Post questions, thoughts or simply whether you like the content.
In This Edition Articles - Mobile Affinity Sorbent Chromatography Of Proteins - Integration of MS and UV Data for Peak Tracking in HPLC Method Development - VMXm takes its First Users 'wher...
View all digital editions
Apr 30 2019 Chicago, IL, USA
Apr 30 2019 Ricoh Arena, Coventry, UK
May 05 2019 St. Louis, MO, USA
May 13 2019 Fort Worth, Tx, USA
May 14 2019 Oklahoma, USA