Quantification of Trace Elements in Naphtha by ICP-OES
Volatile organics like naphtha are amongst the most challenging samples to be analyzed by ICP techniques. Wealth of emission lines originating from the organic matrix and high volatility demonstrate challenges for ICP-OES analyzers. A robust plasma as well as an optical system with high spectral resolution are required in order to routinely quantify trace elements in the low µg/kg range.
For specification analysis in the low µg/kg range ICP-MS often is the method of choice as conventional ICP-OES instruments lack sensitivity due to sample dilution and spectral interferences. On the PlasmaQuant PQ 9000 Elite, the combination of the vertical plasma geometry of its V Shuttle Torch and the unique plasma performance of its High-Frequency generator allow for the uninterrupted and direct routine analysis of undiluted naphtha with excellent method robustness.
Apart from instrumental conditions, sample preparation, calibration strategy and sample introduction play a major role in the analysis of volatile organic matrices. The here presented work describes different calibration strategies as well as the use of different sample introduction systems in order to achieve lowest limits of detection in naphtha in a routine measurement.
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Sebastian Wuenscher (Analytik Jena)
Sebastian Wunscher received his diploma in chemical engineering in 2011 from the Technical University Nuremberg (Germany). Following an industrial research position at Carl Zeiss Vision Australia he started his phd work at the University of Jena (Germany) and the University of Manchester (UK), where he graduated in 2014. In 2015 he started in the position of an Application Specialist for ICP-MS instrumentation at Analytik Jena. Since 2017 he is the responsible product manager for ICP-OES instrumentation and microwave digestion at Analytik Jena.
Lab Asia 30.2 - April 2023
In This Edition Chromatography Articles - On-Column Sample Focussing: a Personal Perspective Mass Spectrometry & Spectroscopy Articles - Multi-scale, multi-modal and operando imaging wi...
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