Newport Corporation, a worldwide leader in laser and photonic solutions to make, manage, and measure light, has introduced the ideal instrument for measuring of weak, scattering or diffuse sources, such as fluorescence, thin film reflectance and atomic emission the new Oriel Matrix Spectrometer. This new solution is the first UV-VIS MMSTM (Multimodal Multiplex Spectroscopy) spectrometer. MMS patent-pending technology removes the primary limitation imposed on traditional dispersive instruments the tradeoff between throughput and resolution.
As a result, the Oriel Matrix Spectrometer delivers twelve times more throughput and SNR than traditional spectrometers, without compromising resolution.
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