• Nanoelectrical and Environmental Control Accessories for Large-Sample AFM Announced

Microscope Accessories

Nanoelectrical and Environmental Control Accessories for Large-Sample AFM Announced

Mar 30 2020

Oxford Instruments Asylum Research announces the release of accessories enabling environmental control and nanoelectrical measurements on the Jupiter XR large-sample atomic force microscope (AFM).The accessories include the PolyHeater, for heating samples up to 300°C, the CoolerHeater, with a cooling/heating range of -30 to 120°C, a fluid cell and probe holder for imaging in liquid, and conductive AFM probe holders for nanoelectrical measurements.

“Many research fields require environmental control, for instance, to mimic real-life conditions or to explore thermal properties. Similarly, nanoelectrical measurements are crucial to fields including semiconductor materials, 2D materials, and other functional materials. These new accessories for Jupiter XR enable even wider experimental possibilities for multi-user, multi-disciplinary laboratories,” said Dr Marta Kocun, Product Manager at Asylum Research.

Jupiter XR features a fully-addressable 200 mm sample chuck, simple and intuitive software control of system setup including laser and detector alignment, automated optimisation of imaging parameters, automated multi-site imaging and analysis, and Asylum Research’s unique blueDrive tapping mode for improved tip lifetime and measurement repeatability. It is also the world’s most versatile large-sample AFM, incorporating Asylum Research’s extraordinary range of capabilities and accessories and a modular design that supports future expansion. The Jupiter XR is the ideal research platform for research environments, high-throughput industrial applications and failure analysis labs. No matter the application, no other large-stage AFM can match Jupiter’s ease of use, speed, performance and flexibility.


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