• Bruker Introduces Two New Analytical Accessories for Electron Microscopes

Microscope Accessories

Bruker Introduces Two New Analytical Accessories for Electron Microscopes

Sep 04 2013

This new product introduction further expands the company’s portfolio of high-performance tools for materials characterisation in electron microscopes:

XSense™ is a novel parallel beam wavelength dispersive X-ray spectrometer (WDS) for elemental analysis on scanning electron microscopes (SEM). Specifically designed for the lower energy range, the XSense spectrometer provides energy resolution down to 4 eV, enabling both excellent separation of closely spaced X-ray lines and highly sensitive trace element detection.

XSense™ is a new micro-spot X-ray source that enables photon-induced micro X‑ray fluorescence (micro-XRF) spectrometry on SEM systems, in conjunction with Bruker’s energy dispersive X-ray spectrometer (EDS) detectors. In comparison with electron-excited X-ray spectrometry commonly used for elemental analysis on SEMs, micro-XRF spectrometry provides 20 to 50 times lower limits of detection, adding the capability of detecting and analysing trace amounts of higher-Z elements in the sample.

Both the XSense WDS analyzer and the XTrace micro X-ray source are operated via ESPRIT 2.0, Bruker’s new and unique 4-in-1 analytical software suite which seamlessly integrates EDS, WDS, EBSD and Micro-XRF under a single user interface. 

With the introduction of these new products Bruker is now the only vendor to offer five techniques, EDS, WDS, EBSD, Micro-XRF and Micro-CT, as high-performance add-on analysers for electron microscopes.


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