Catalogue of Accessories for Microscopy
Oct 14 2010
Agar Scientific used Microscience 2010 to launch their eighth comprehensive new microscopy accessories catalogue and to host two workshops given by their principals, Kleindiek Nanotechnik and
Agar serves the three main channels of microscopy supplying instrumentation and accessories for the electron, light and scanning probe microscopy communities. As well as the traditional items expected in such a comprehensive catalogue of consumables and accessories, Agar has introduced new sections dedicated to some of microscopy’s growth applications areas.
The Kleindiek workshop described in situ force measurements as low as 1nN applying piezo resistive cantilevers in combination with precise manipulators with resolutions of 0.25nm. Versatile solutions for TEM
sample preparation, manipulation at the micro and nano scales and electrical probing in situ were also discussed. These techniques deliver high sample throughput by employing dedicated tools in the shape of small, load-lockable platforms holding all necessary components for the application.
Fischione’s workshop described the new NanoMill®, a new tool that incorporates a concentrated ultra low energy Argon ion beam of just two microns in diameter for sample preparation for sub Angstrom microscopy. The NanoMill has been successfully applied to a board range of materials from silicon to metals. Examples were presented to illustrate the practical benefits of use. Agar supplies one of the broadest ranges of accessories and consumables for microscopy. The complete range is available in the new catalogue.
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