Microscopy & Microtechniques
New MFP-3D? Extended Atomic Force Microscopy Scan Head for High Feature Samples
Dec 20 2005 Read 1795 Times
The MFP-3D Extended Head utilizes the same Nanopositioning System (NPS?) sensors found in the standard head for unprecedented precision and accuracy, low noise, and image clarity. Z Sensor noise is <0.3nm Adev in a 0.1 Hz-1 kHz bandwidth (BW) and sensor non-linearity less than 0.2% (Adev/full travel) at full scan; Z height noise <0.06nm Adev, 0.1 Hz-1kHz BW.
Asylum Research manufactures advanced scientific instrumentation, including AFMs/ Scanning Probe Microscopes (SPMs), for nanoscale science and technology. An AFM/SPM is one of the premier instruments used for measuring surfaces and surface properties at the nanometer level.
Do you like or dislike what you have read? Why not post a comment to tell others / the manufacturer and our Editor what you think. To leave comments please complete the form below. Providing the content is approved, your comment will be on screen in less than 24 hours. Leaving comments on product information and articles can assist with future editorial and article content. Post questions, thoughts or simply whether you like the content.
In This Edition Articles - Determination of heroin in street drug samples with printable surface enhanced Raman scattering (P-SERS) - Advances in Protein Sample Preparation: Centrifugation i...
View all digital editions
Dec 14 2018 Kathmandu, Nepal
Jan 16 2019 Tokyo, Japan
Jan 28 2019 Dubai International Convention & Exhibition Centre
Jan 30 2019 Tokyo, Japan
Jan 31 2019 Paris, France