• New MFP-3D? Extended Atomic Force Microscopy Scan Head for High Feature Samples

Microscopy & Microtechniques

New MFP-3D? Extended Atomic Force Microscopy Scan Head for High Feature Samples

Dec 20 2005

Asylum Research, a leading manufacturer of atomic force microscopes (AFMs), announces the availability of the new MFP-3D Extended Head for use in its MFP-3D Atomic Force Microscopy (AFM) Systems. The new head design allows a 28µm scan range in Z for samples with higher features, and in particular, for bioscience applications including living cells, plant imaging, and for pulling on long chained molecules.

The MFP-3D Extended Head utilizes the same Nanopositioning System (NPS?) sensors found in the standard head for unprecedented precision and accuracy, low noise, and image clarity. Z Sensor noise is <0.3nm Adev in a 0.1 Hz-1 kHz bandwidth (BW) and sensor non-linearity less than 0.2% (Adev/full travel) at full scan; Z height noise <0.06nm Adev, 0.1 Hz-1kHz BW.

Asylum Research manufactures advanced scientific instrumentation, including AFMs/ Scanning Probe Microscopes (SPMs), for nanoscale science and technology. An AFM/SPM is one of the premier instruments used for measuring surfaces and surface properties at the nanometer level.

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