Microscopy & Microtechniques
New MFP-3D? Extended Atomic Force Microscopy Scan Head for High Feature Samples
Dec 20 2005
The MFP-3D Extended Head utilizes the same Nanopositioning System (NPS?) sensors found in the standard head for unprecedented precision and accuracy, low noise, and image clarity. Z Sensor noise is
Asylum Research manufactures advanced scientific instrumentation, including AFMs/ Scanning Probe Microscopes (SPMs), for nanoscale science and technology. An AFM/SPM is one of the premier instruments used for measuring surfaces and surface properties at the nanometer level.
Digital Edition
Lab Asia 31.2 April 2024
April 2024
In This Edition Chromatography Articles - Approaches to troubleshooting an SPE method for the analysis of oligonucleotides (pt i) - High-precision liquid flow processes demand full fluidic c...
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