Microscopy & Microtechniques
New MFP-3D? Extended Atomic Force Microscopy Scan Head for High Feature Samples
Dec 20 2005
The MFP-3D Extended Head utilizes the same Nanopositioning System (NPS?) sensors found in the standard head for unprecedented precision and accuracy, low noise, and image clarity. Z Sensor noise is
Asylum Research manufactures advanced scientific instrumentation, including AFMs/ Scanning Probe Microscopes (SPMs), for nanoscale science and technology. An AFM/SPM is one of the premier instruments used for measuring surfaces and surface properties at the nanometer level.
Digital Edition
Lab Asia 29.4 - August 2022
August 2022
In This Edition Chromatography - Automated Sample Preparation:The Missing Hyphen to Hypernation - New Low Volume Air Sampler for PFAS Analysis - Analytical Intelligence Starts with the Samp...
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Events
ACS National Meeting & Expo, Fall 2022
Aug 21 2022 Chicago, IL, USA & Online
Aug 22 2022 Frankfurt, Germany
Aug 27 2022 Maastricht, Netherlands
Aug 28 2022 Lisbon, Portugal
Aug 31 2022 Singapore