Microscopy & Microtechniques
New MFP-3D? Extended Atomic Force Microscopy Scan Head for High Feature Samples
Dec 20 2005
The MFP-3D Extended Head utilizes the same Nanopositioning System (NPS?) sensors found in the standard head for unprecedented precision and accuracy, low noise, and image clarity. Z Sensor noise is <0.3nm Adev in a 0.1 Hz-1 kHz bandwidth (BW) and sensor non-linearity less than 0.2% (Adev/full travel) at full scan; Z height noise <0.06nm Adev, 0.1 Hz-1kHz BW.
Asylum Research manufactures advanced scientific instrumentation, including AFMs/ Scanning Probe Microscopes (SPMs), for nanoscale science and technology. An AFM/SPM is one of the premier instruments used for measuring surfaces and surface properties at the nanometer level.
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