Combined Morphological and Chemical Particle Analysis with ESPRIT Feature

Based on the speed and accuracy of Bruker’s QUANTAX EDS system with its powerful and intuitive ESPRIT software, the Feature module brings new capabilities to the microanalysis package. The ability to automatically detect, measure and analyze any kind of particle or feature, whilst providing its chemical classification using the high throughput capability of the XFlash^® silicon drift detectors, is at the heart of this solution.

ESPRIT Feature uses a method-based approach, meaning the configuration for particle detection and chemical classification can be stored as a method. Once set up by the expert, such a feature analysis method can be used over and over by the less experienced user.

Feature analysis benefits from the high speed of the XFlash^® detectors as well as the QUANTAX image digitizer, and gains accuracy from the superior element identification through the modern atomic data library and configurable quantification.

Combined morphological and chemical classification provides comprehensive sample information, select one or multiple columns from a results histogram and immediately see which particles fall into the according range.

The full integration with the ESPRIT microanalysis software package allows the feature analysis to be automated via ESPRIT Jobs. All settings and methods can be selected for a fully automated feature and chemical classification run, permitting unattended analysis of large areas and samples.