• New UV-laser Scanning Confocal Microscope

Microscopy & Microtechniques

New UV-laser Scanning Confocal Microscope

Jan 27 2006

Following the recent launch of the LEXT confocal laser scanning microscope for ultra-precise surface analysis, Olympus is now running an on-line special feature on this new metrology system. The animated ?web special' takes the viewer through the applications and exceptional analytical capabilities of the LEXT in a visually interesting and easy to follow format.

The web demonstration illustrates the real time 3D observation and acquisition of high precision measurements from samples placed directly onto the microscope stage with no prior preparation. These advanced features are possible because the LEXT combines advanced colour and laser scanning confocal microscopy techniques.

The web special also enables the viewer to evaluate numerous application images in 2D and 3D, from metal corrosion on automotive parts to the measurement of the laser mark depth for bare wafer manufacture. The LEXT can profile objects that are normally difficult to scan using conventional methods, such as those with differing surface properties or slanted regions.
The LEXT's image processing features are explored in detail, including noise filtering, curve and tilt compensation and edge contrast and enhancement. In addition, its analytical capabilities are demonstrated, including particle analysis and 2D, depth, volume/surface area, line width and geometrical measurements.

The web special also provides an animated explanation of the LEXT's specially developed MEMS-Scanner (Micro-Electro Mechanical System) which increases the speed and reproducibility of the scanning process compared to conventional technologies.

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