• The New Generation of Scanning Probe Microscopes

Microscopy & Microtechniques

The New Generation of Scanning Probe Microscopes

Dec 20 2005

Windsor Scientific has launched the new Nanosurf easyScan2 series of scanning probe microscopes. The portable and easy-to-use easyScan2 offers a unique, fully modular design giving you a professional and affordable system tailored to meet your individual requirements.

Modular inserts into a single electronics box extends the controllers capabilities and can take you from basic AFM imaging with a further option of dynamic force capabilities to atomic resolution STM imaging. Various scan heads and software modules add to the flexibility of the easyScan2 system.

The neat, transportable easyScan2 STM module permits quick atomic resolution imaging on a normal table without the need for expensive vibration isolation. Rapid tip and sample exchange makes the instrument ideal for both teaching and research applications.

The Nanosurf easyScan2 software is standard for all heads with automatic head recognition and users can select the software level from easy through to advanced. The instrument capabilities extend from spot checking nanocircuitry to phase contrast and spreading resistance measurements. The instrument is able to satisfy a full range of applications from visualising nanostructure surfaces or diffraction gratings in a wide variety of industries from display aerospace to engineering and electronics to materials research.

Digital Edition

Lab Asia Guide 2022/23

October 2022

In This Edition Chromatography - Eco-Friendly RP-HPLC - Replacing Acetonitrile with Isopropanol in analytical and purification utilising Core-Shell Chromatography - New Gas Chromatographs fo...

View all digital editions

Events

SPIE Photonex

Dec 06 2022 Birmingham, UK

CPhI & P-MEC China 2022 - NEW DATES

Dec 20 2022 Shanghai, China & Online 21 November 2022 to 13 January 2023

Smart Factory Expo 2023

Jan 25 2023 Tokyo, Japan

Arab Health

Jan 30 2023 Dubai, UAE

Nano Tech 2023

Feb 01 2023 Tokyo, Japan

View all events