• The New Generation of Scanning Probe Microscopes

Microscopy & Microtechniques

The New Generation of Scanning Probe Microscopes

Dec 20 2005

Windsor Scientific has launched the new Nanosurf easyScan2 series of scanning probe microscopes. The portable and easy-to-use easyScan2 offers a unique, fully modular design giving you a professional and affordable system tailored to meet your individual requirements.

Modular inserts into a single electronics box extends the controllers capabilities and can take you from basic AFM imaging with a further option of dynamic force capabilities to atomic resolution STM imaging. Various scan heads and software modules add to the flexibility of the easyScan2 system.

The neat, transportable easyScan2 STM module permits quick atomic resolution imaging on a normal table without the need for expensive vibration isolation. Rapid tip and sample exchange makes the instrument ideal for both teaching and research applications.

The Nanosurf easyScan2 software is standard for all heads with automatic head recognition and users can select the software level from easy through to advanced. The instrument capabilities extend from spot checking nanocircuitry to phase contrast and spreading resistance measurements. The instrument is able to satisfy a full range of applications from visualising nanostructure surfaces or diffraction gratings in a wide variety of industries from display aerospace to engineering and electronics to materials research.

Digital Edition

Labmate UK & Ireland September 2021

September 2021

In This Edition Articles - The challenges of Biosample access and what needs to change - Innovative UK exports must gather income - not dust Spotlight Life Sciences - How a Pipettin...

View all digital editions

Events

Water Expo Nigeria 2021 - NEW DATES

Sep 21 2021 Lagos, Nigeria

17th Confocal Raman Imaging Symposium

Sep 27 2021 Virtual event

BCEIA 2021

Sep 27 2021 Beijing, China

Photonex & Vacuum Expo

Sep 28 2021 Glasgow, Scotland

Chemspec Digital 2021

Sep 29 2021 Online event

View all events