New Benchtop WDXRF Elemental Analyzer: Supermini200

As the world's only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material, the all new Rigaku Supermini200 uniquely delivers low cost-of-ownership (COA) with high resolution and lower limits-of-detection (LLD).

Low cost of ownership

Not only is the new Rigaku Supermini200 an affordable choice for your XRF elemental analysis needs, the running costs are also low. P10 gas for the flow proportional detector is the only consumable. Supermini200 does not require a source of cooling water, plumbing, or an external chiller, thereby decreasing system maintenance and lowering the overall lifetime cost of ownership of the system and yearly budgets for consumables and maintenance.

Superior light element performance

Analyzing complex matrix materials with a wide range of light and heavy elements, from trace to high concentration levels, is the instrument's core competency. Rigaku Supermini200 delivers high sensitivity for light elements with superior spectral resolution for resolving line overlaps in a complex matrices without the need for deconvolution. Analyzing low concentration levels of light elements (O, F, Na, Mg, Ca, Si, Al, and P) is easy.

High power X-ray tube

Supermini200 is the only high powered (200 W) X-ray tube benchtop WDXRF system, providing excellent excitation resulting in lower detection limits and shorter measurement times. A unique and proprietary optical system is also employed to enhance sensitivity beyond the gains of the tube power.

EZ Analysis and EZ Scan

EZ Analysis is a new feature that makes every day routine operation simpler. A single interface contains everything you need to know about the status of your samples, what your data measurement parameters are, what your data analysis parameters are, and a running output of your results. EZ Scan allows you to analyze unknown samples without any prior setup and with only a few clicks of the mouse to get started. Combined with Rigaku’s SQX fundamental parameters software, it provides the most accurate and rapid XRF results possible. SQX is capable of automatically correcting for all matrix effects, including line overlaps. SQX can also correct for various atmospheres, impurities and sample fi lm.

Increased accuracy is achieved using a matching library.

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