News & Views
RMS Elected Fellow
Jun 19 2020
Congratulations go to Professor Peter Nellist, University of Oxford, who has been elected as a Fellow of the Royal Society.
Peter is a materials scientist who has pioneered new techniques for atomic-resolution microscopy, his work has focused on scanning transmission electron microscopy and its application across a range of functional and structural materials. He is known for the practical implementation of electron ptychography which allows light elements to be detected while reducing beam-induced damage, and to the theory underlying quantitative image interpretation. He has made fundamental contributions to the development of for the inherent aberrations of electron lenses and their use for the three-dimensional imaging of materials.
Digital Edition
Lab Asia 31.2 April 2024
April 2024
In This Edition Chromatography Articles - Approaches to troubleshooting an SPE method for the analysis of oligonucleotides (pt i) - High-precision liquid flow processes demand full fluidic c...
View all digital editions
Events
Apr 25 2024 Istanbul, Turkey
Apr 28 2024 Montreal, Quebec, Canada
May 05 2024 Seville, Spain
InformEx Zone at CPhl North America
May 07 2024 Pennsylvania, PA, USA
May 14 2024 Oklahoma City, OK, USA