RMS Elected Fellow

Congratulations go to Professor Peter Nellist, University of Oxford, who has been elected as a Fellow of the Royal Society.

Peter is a materials scientist who has pioneered new techniques for atomic-resolution microscopy, his work has focused on scanning transmission electron microscopy and its application across a range of functional and structural materials. He is known for the practical implementation of electron ptychography which allows light elements to be detected while reducing beam-induced damage, and to the theory underlying quantitative image interpretation. He has made fundamental contributions to the development of for the inherent aberrations of electron lenses and their use for the three-dimensional imaging of materials.