Revolutionizing EDS analysis on TEMs using silicon drift detectors

Silicon drift detectors (SDD) are a well established technology for energy dispersive spectroscopy (EDS) on scanning electron microscopes. Bruker AXS Microanalysis, as the technological leader in this field, is the first company that has adapted SDDs for optimal operation on transmission electron microscopes (TEM). The XFlash® 5030 T is Bruker‘s detector for this application. Its design has been optimised to cause no interference with the electron optics of all types of transmission and scanning transmission electron microscopes, including aberration corrected instruments. We have planned a webinar on Wednesday 16 September 2009 to present this new detector and its applications.

During this webinar we will explain the technology of SDDs and particularly focus on Bruker‘s adaptation to (S)TEM operation. We will also introduce the ESPRIT software features for transmission electron microscopy included with Bruker‘s QUANTAX EDS systems. Application examples from materials science will be presented to demonstrate the performance of the XFlash® on (S)TEMs.

For more information and registration Please click HERE