The N8 NEOS Senterra – combined AFM and Raman measurement

Bruker Nano and Bruker Optics have launched the new N8 NEOS Senterra, combining the proven Senterra Raman and N8 NEOS AFM platforms. This novel instrument enables morphological and structural/chemical mapping of the same sample area. The calibrated sample positioning allows simple and precise serial measurements, and the Raman spectra can be easily located within the AFM image.

The N8 NEOS Senterra combines the flexibility of the Raman with intuitive AFM control. The compact Senterra Raman system has software-selectable lasers and gratings (to facilitate specific excitation wavelengths and specific spectral resolutions for each sample). Thanks to the patented Sure_Cal technology, the Senterra is permanently aligned for the wavelength scale with a wavelength stability specified to 0.1 cm-1 RMS. Switching between high throughput and confocal mode is also motorized and software-controlled (patented, FlexFocus). The alignment-free AFM optics & user-friendly design (e.g. non-contact amplitudes are denoted in nm and not V) make the N8 NEOS Senterra ideal for research applications or for multi-user centres where flexibility and ease-of-use are essential prerequisites. Throughput and results are guaranteed.

Optimum stability is achieved by the mounting of the Senterra on the N8 NEOS base, whilst Raman point mapping is realised using the included confocal optical microscope. Topography and chemical composition of any sample can be analyzed on the same position without sample translation.

Raman spectroscopy? Atomic Force Microscopy? Two questions, one answer: N8 NEOS Senterra

For more information please visit our N8 NEOS Senterra page