•  Fully Intergrated Size and Shape Analysis with Cilas Particle Size and Shape Analyzers

Microscopy & Microtechniques

Fully Intergrated Size and Shape Analysis with Cilas Particle Size and Shape Analyzers

Oct 06 2009

For many applications, particle shape information is a critical indicator of overall performance. To meet this demand, CILAS engineers have developed a system integrating both particle size and particle shape analysis into a single elegant package. CILAS laser particle size analyzers provide you with an innovative solution for both particle size and shape measurements.

CILAS has developed the world’s only laser particle size analyzer with a fully integrated imaging system. This integrated solution allows the user to analyze the same exact sample in both laser diffraction and imaging modes. Images obtained from the imaging system provide an effective tool in validating the method. As an example, the operator can easily verify the presence of particle agglomerates which might have been reported as larger particles.

CILAS has developed the new solution to analyze the shape of particles using an inverted optical microscope combined with a CCD camera which is connected to a USB port to capture images.

A large choice of images and parameters
The images are then processed using the integrated and intuitive ExpertShape application.
With the CILAS ExpertShape software, customers can obtain more than 40 particle shape properties such as roundness, convexity, sphericity, aspect ratio, area, shape factor and many more. This provides a cost effective tool for the analysis of particle shape.

The software can be configured to automatically acquire and analyze multiple samples, allowing the acquisition of hundreds of images and thousands of particles without any manual intervention.

A customized report
ExpertShape software allows the user to generate custom configured reports. These reports can be configured to export data in either HTML or Excel format. Reports can include the following information:

  • Particle images
  • Size distribution results
  • Single and mean results
  • Threshold displays
  • Specific parameter trending

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