Scanning Stages for Highly Accurate Positioning of Samples

Physik Instrumente’s (PI) technology is benefitting microscopy through the PInano™ low-profile (20mm) piezo scanning stages. Designed for positioning samples in high-resolution optical microscopy, PInano’s P-545 XY or XYZ piezo-driven scanning and positioning stage provides travel ranges of up to 200μm in two or three axes, with position resolution in the nanometer range.

Integrated piezo ceramic PICMA® actuators offer maximum reliability with a proven superior lifetime. Featuring a large central aperture for transmitted light microscopy, PInano can accommodate holders for Petri dishes or standard object slides (25 x 75mm), with additional accessories also available.

PInano’s integrated data recorder collects motion parameters, in addition to system parameters, and a wave generator controls the motion of the stage using diverse pre-set and user-defined motion profiles. The piezo controller is supplied with Windows® operating software, and with its extensive software support, comprehensive DLLs, LINUX and LabVIEW drivers are available for automated control. Additionally, the software supports a series of common image acquisition systems, such as μManager and MetaMorph®. A 24-bit resolution USB port, as well as ethernet, RS-232 and analog interfaces, is supplied as standard.

Complementing the P-545 stage is the M-545 manual XY open-frame microscopy stage. Fitting directly onto all common inverse light microscopes, this carries the piezo stage and allows sample movement along larger travel ranges. If required, the M-545 stage can also be equipped with stepper motor drives.