A POTENTIAL STANDARD FOR EBSD

The RMS Electron Backscatter Diffraction Meeting (26 - 28 March) was held at the New Lanark Mill, Scotland New Lanark Mill is a World Heritage Site and the meeting attracted support from the European Microscopy Society. The meeting provided a forum for EBSD users old and new to discuss the most recent ideas and innovations in EBSD and related techniques. This year was the largest meeting yet with registrations up 20% and delegates from all over Europe. The developments in Electron Back Scattered Diffraction since the 1980s has led to commercial equipment for obtaining large amounts of data automatically. This has enabled Industrial users to become interested in adopting the technique for a wide range of applications such as grain sizing; simultaneous EDS and EBSD analysis for characterisation of particles and attempts at measuring the consequences of strain after deformation. As the technique moves from an academic environment there is a need for standards which enable an industrial laboratory to quickly perform the technique reliably and achieve accreditation in the area." "It is hoped that the new standard will provide the information for laboratories to quickly and reliably perform EBSD and form the basis of accreditation for laboratories." Peter Quested has worked at the National Physical Laboratory for many years. Amongst his interests are the characterisation of nickel base superalloys for high temperature applications and during his career he has applied a number of techniques. He first became interested in EBSD in the mid 1980s as a method for characterising single crystal superalloys and attempted to characterise the effects of creep strain on EBSD Patterns. Recently he was asked to help with the UK contribution to the standard through BS CII/9 and TC202. The poster was intended to build bridges between the academic community and the industrial users. Examples of industrial applications (ex Ken Mingard, NPL)