• New Detector and Viewport Options for Micro Elemental Analyser System

Microscopy & Microtechniques

New Detector and Viewport Options for Micro Elemental Analyser System

Jul 11 2012

Edax Inc has introduced new detector and sample viewport options for its Orbis micro-XRF elemental analyser system. The new detector is a thermoelectrically cooled 50mm2 Silicon Drift Detector (SDD) capable of high-resolution spectral acquisition at high count rates.

In applications where the detector is signal ‘starved’, the new SDD detector can collect the same spectral data in half the time as a standard Orbis 30 mm2 SDD detector. In applications where the standard SDD detector is signal saturated (e.g. measurements on ferrous alloys), use of the new detector also can be beneficial, since the X-ray tube current can be reduced, which can potentially extend tube life.

Edax also has introduced a sample viewport mounted into the chamber door of the Orbis analyser. The large, X-ray safe window allows an analyst to easily verify general sample targeting among many small samples or among multiple sample trays. Or, if the sample in question is large, the analyst can easily view the orientation of the sample on the stage or the position of the sample with respect to the surrounding sample chamber walls.

The new SDD detector is available immediately for new Orbis systems with a field upgrade kit planned for installed Orbis systems in the near future. The sample viewport also is available currently as an option on new Orbis systems and as a field upgrade on existing installations.


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