Launch of Next Generation Turnkey Optical Tweezers System

JPK unveiled the new NanoTracker 2 optical tweezers system at the 2013 Biophysics Annual Meeting held in Philadelphia. Visitors to the conference and exhibition had a first impression about the new system first hand.

JPK, with a reputation as the ‘force tool shop’ for researchers in techniques such as Bio AFM and force spectroscopy, decided to develop a system to meet the needs of the practising applications scientist. These are people who work in the areas that include biophysics, biochemistry, polymer science, biology, single molecule mechanics groups, cell sorting and manipulation. In total, this means all people who are working with small particles interacting with their environment - and measuring their forces. This optical tweezers platform provides force and interaction measurement in parallel with optical microscopy using complementary spectroscopic techniques.

By talking with users of optical tweezers systems, both the home-builders and of their first-generation system, JPK has come up with a system which minimises user interactions on a platform which has been built with increased stability and lower noise to improve detection. With force measurements being so important to users, JPK has enabled new open routines for the user to design their own enhanced measurements. It also provides new force clamp and signal multiplexing and de-multiplexing capabilities by utilising acousto-optic deflectors which spatially control the optical beams.

As CTO, Torsten Jähnke, described the system, "We have developed a more integrated-design approach than before. For example, it makes single molecule experiments such as DNA stretching or cell/particle experiments much more straightforward. This saves time for the user who now has the full control of all parameters in one control and analysis software package."

The new system comes with an overall improved performance especially for the beam steering through highly accurate pivot-point piezo mirrors and the detection system which benefits from a complete redesign of the optical pathway. The resulting better linearity and diminished crosstalk improve all sensitive force measurements. New functions are also implemented for a more precise trap calibration which allows the extraction of additional material properties.

The full capabilities of the system are described in detail in a new eight page product brochure which is available free at JPK's website.