• Even, Equal and Simultaneous Imaging Perfection

Microscopy & Microtechniques

Even, Equal and Simultaneous Imaging Perfection

May 18 2010

Longstanding TIRF microscopy specialist Olympus has introduced the new advanced cell^TIRF system as part of its newly launched xcellence live cell fluorescence imaging station.

This superior multi-laser independent beam path technology, combined with new TIRFM objectives covering the broadest selection available, ensures that cell^TIRF delivers a new level of sensitivity and precision in multi-colour TIRFM. Olympus offers six dedicated TIRFM objectives of exceptional optical quality, including the highest resolution available with a numerical aperture of 1.69 NA, as well as the highest magnification at 150x (1.45 NA). This means that TIRFM investigations can be carried out with penetration depths down to 40nm.

Newly available objectives offering increased numerical apertures of 1.49 at 100x and 60x magnification ensure excellent angle flexibility, enabling small penetration depths. Exceptional software integration and mechanics along with these objectives mean that users can precisely and automatically adjust laser penetration with 1nm accuracy at the click of a button. This is possible as cell^TIRF is fully integrated into the
xcellence real time imaging system with automatic device configuration via ODB (Olympus Data Bus), enabling fast switching and precise control of hardware, including the TIRF condenser and laser lines.

Enabled by the xcellence software, just one button is required to switch between critical angle, defined penetration depth and laser widefield illumination. Highly inclined and laminated optical (HILO) sheet imaging is also enabled due to the XY-adjustable field stops for every laser beam. Furthermore, fine adjustment is possible via the mouse wheel or keyboard. Complete integration within the Experiment Manager, a graphical experiment construction tool also enables specialised TIRFM commands for sophisticated applications, such as experiments with varying penetration depths combined with widefield and confocal microscopy


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