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  • RMS Meeting: EBSD 2020

RMS Meeting: EBSD 2020

Jan 21 2020 Read 312 Times

Scientific Organiser: Prof Bradley Wynne, University of Sheffield

The 2020 EBSD meeting will take place at The Edge, Endcliffe Village, at the University of Sheffield., April 21 – April 2. The annual meeting draws together the whole Electron Backscatter Diffraction (EBSD) community, including leading international research scientists and engineers, early career researchers and students to highlight the latest developments, from technique development through to applications.

We are anticipating contributions that range in scope spanning the geoscience, materials science & engineering and mechanical engineering disciplines, as well as emerging applications from the biological communities. Talks will likely include state-of-the-art developments in instrumentation, new software algorithms and new techniques developments, as well as the use of EBSD, transmission Kikuchi diffraction, electron channelling contrast imaging (ECCI) and related microscopy modalities. Additionally, we anticipate hearing applications driven talks which engage these approaches to reveal new insight into the microstructure of materials systems in emerging scientific applications and industrial challenges, particularly the use of EBSD data in Industry 4.0.

This year’s meeting will be preceded on Monday 20 April, by one of two optional workshops, for both advanced and novice users. The advanced course, delivered by Prof Joao Fonseca’s group at the University of Manchester, focusses on the use and understanding of High-Resolution Digital Image Correlation (HRDIC) combined with EBSD, centred on technical requirements and the underlying principles of post-processing data analysis. The novice course, delivered by Prof Brad Wynne, focusses on understanding what is under the hood of your EBSD software, with particular emphasis on maximising the potential of your EBSD data both before acquiring your data and during its analysis.  For further details please visit www.rms.org

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