• Dynamic Image Analysis and the QC of Coffee Beans

Laboratory Products

Dynamic Image Analysis and the QC of Coffee Beans

Aug 25 2023

Anton Paar recently launched the Litesizer DIA 500, a state-of-the-art dynamic image analyser. By using dynamic image analysis, the measuring technique behind the Litesizer DIA 500, users can directly measure without having to conduct statistical calculations based on physical parameters, giving them the possibility to even detect single outlier particles in their overall sample population.  

Litesizer DIA 500 can help users with a range of applications, including the quality control of coffee beans. With an estimated 2.2 billion cups drunk each day, coffee is one of the most widely consumed beverages globally and one of the most traded agricultural commodities.

While the main sources of variability for beans are climate, soil type, topography, and storage, the roasting and grinding steps are also major sources of variability for the finished product. As part of this, establishing quality control criteria is an essential tool to minimise the amount of tasting necessary, both for whole roasted beans and for ground coffee.

The new application report 'Know Your Beans: Quality Control of Coffee by Dynamic Image Analysis' demonstrates comparison measurements between two whole bean samples to highlight contamination with fine particles.

Subsequently, the samples are ground with four different settings. Measurements are conducted on the ground coffee to monitor the correct particle size for the intended brewing method.

Download the application report to find out more.

More information online


Digital Edition

MAC Guide 2023/24

December 2023

Buyers Guide - Major producers of analytical equipment who wish to introduce and sell their products to buyers in science and industry - Over 1,000 products and services that these companys man...

View all digital editions

Events

Instrumentation Live

Jan 17 2024 Birmingham, UK

Smart Factory Expo 2023

Jan 24 2024 Tokyo, Japan

Arab Health

Jan 29 2024 Dubai, UAE

Nano Tech 2024

Jan 31 2024 Tokyo, Japan

SLAS 2024

Feb 03 2024 Boston, MA, USA

View all events