Ultra Fast Depth Profiling with the GD Profiler 2

Researchers from Material Science Departments

Whether you do research on corrosion, elaboration of coatings, or treatment of materials, the GD Profiler 2 is the analytical companion tool you need.

• Ultra Fast Depth Profiling of materials and layers (conductive or non)

• Determination of the chemical composition as a function of depth

• Simultaneous measurement of all elements (including H, O, N, C, Cl etc)

• Follow up of diffusions, interlayer mixings, interfaces contaminations

The instrument relies on the sputtering of the material by an RF plasma and the analysis of the sputtered species by an optical spectrometer.

Recent published applications include Li batteries, ion implantation, thermal treatments, migration of species during treatment on Al, PVD coatings or the use of the instrument for sample preparation in SEM.

Horiba Jobin Yvon.