• High performance Elemental Analyser with Touchscreen

Mass Spectrometry & Spectroscopy

High performance Elemental Analyser with Touchscreen

Jan 08 2014

The new compact, benchtop Rigaku NEX QC+ energy dispersive X-ray fluorescence (EDXRF) elemental analyser delivers rapid qualitative and quantitative determination of major and minor atomic elements, from sodium (11Na) through uranium (92U), in a wide variety of sample types.


  • Analyse 11Na to 92U non-destructively
  • Solids, liquids, alloys, powders and thin films
  • 50kV X-ray tube for wide elemental coverage
  • SDD detector for superior data quality
  • Modern 'icon driven' user interface
  • Multiple automated tube filters for enhanced sensitivity
  • Convenient built in thermal printer
  • Low cost with unmatched performance-to-price ratio
  • Optional fundamental parameters

Optimised for quality control applications

Specifically designed for routine quality control applications, the new Rigaku NEX QC+ features an intuitive 'icon-driven' touch screen interface for easy operation and a built-in printer for convenience.

Rugged and easily transportable for use in the field

Rigaku’s NEX QC+ was specifically designed for deployment outside of the laboratory environment. At 16 kg (35 lbs.), it is easy to pick up and carry. NEX QC is perfect for use in service trucks (see photo of unit operating in a truck bed performing  oil field measurements), mobile labs, huts, trailers and temporary field facilities .

High precision with broad elemental coverage

Analyse 11Na (sodium) through 92U (uranium) across a wide range of matrices. The shuttered 50kV X-ray tube and Peltier cooled Silicon Drift Detector (SDD) detector delivers exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution and counting statistics. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of applications versatility and low limits-of-detection (LOD).  

Autosampler, helium and FP options

Options include fundamental parameters (FP) to reduce the number of standard required for any particular application, an automatic sample changer, a sample spinner and helium purge for enhanced light element sensitivity.

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