Rapid, High Resolution 3D Surface Analysis

The Axio CSM 700 confocal microscope from Carl Zeiss meets users’ demands for rapid and robust non-contact measurement of 3D microstructures and determination of surface roughness. Ideal for materials research, quality inspection and routine applications, the Axio CSM 700 displays surfaces three-dimensionally in high resolution and in true colour even on relatively "soft" surfaces.

The high-quality ZEISS optics allow topographical measurements to be performed at up to 117 frames per second. Step heights from approximately 20 nm up to the millimetre range are detected at a depth of focus previously only possible with the scanning electron microscope. These attributes will be useful in the examination of many materials, including LCD panels, semiconductors, colour filters, glass, polymers and metals.

Despite the new microscope’s outstanding functionality, it is easy to operate, with all the major functions and measurement parameters controlled through the large, LCD control panel. This comprehensive control is complemented by the intuitive control software, which provides many analysis options, including the measurement of roughness, evaluation of layer thickness and particle analysis.