Microscopy & Microtechniques
Enhanced Functionality for Excellent Performance – The Olympus LEXT OLS4000 Optical Metrology Instrument
Jul 26 2010
The LEXT OLS4000 confocal laser scanning microscope metrology system brings a number of additional features and enhanced functionality, including near-vertical slope capabilities, larger optical zoom and navigation overview window. The new software also brings even the most complex of processes within easy reach of a broader range of users, with the use of different user interface sheets for the main tasks –acquisition, analysis and reporting. As well as these internal functional improvements, the whole system has a sleeker look and now only requires a single control unit. The LEXT OLS4000 not only matches the challenges of the measurement laboratory, but also leads the way in establishing optical technology as the most flexible measurement systems available – Optical Metrology. Olympus.
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