• Ultra Fast Elemental Depth Profiling with the New GD-Profiler 2

Chromatography

Ultra Fast Elemental Depth Profiling with the New GD-Profiler 2

Apr 10 2008

Having a large variety of applications? Interested in Surface Analysis?
Controlling PCD/CVD, galvanised steels, oxide films etc, or studying corrosion mechanisms? RF Glow Discharge Optical Emission Spectrometry
provides quantitative depth profiles from the first atomic layers down to the bulk (more than 150 microns) with sputtering rates typically 1000 times faster than other surface techniques.
For more information contact Horiba Jobin Yvon


Digital Edition

Lab Asia 31.2 April 2024

April 2024

In This Edition Chromatography Articles - Approaches to troubleshooting an SPE method for the analysis of oligonucleotides (pt i) - High-precision liquid flow processes demand full fluidic c...

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