Ultra Fast Elemental Depth Profiling with the New GD-Profiler 2

Chromatography

Ultra Fast Elemental Depth Profiling with the New GD-Profiler 2

10 Apr, 2008

Published over 18 years ago. See the latest and most current information on Chromatography.

Having a large variety of applications? Interested in Surface Analysis?
Controlling PCD/CVD, galvanised steels, oxide films etc, or studying corrosion mechanisms? RF Glow Discharge Optical Emission Spectrometry
provides quantitative depth profiles from the first atomic layers down to the bulk (more than 150 microns) with sputtering rates typically 1000 times faster than other surface techniques.
For more information contact Horiba Jobin Yvon

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