Chromatography
Ultra Fast Elemental Depth Profiling with the New GD-Profiler 2
Apr 10 2008
Controlling PCD/CVD, galvanised steels, oxide films etc, or studying corrosion mechanisms? RF Glow Discharge Optical Emission Spectrometry
provides quantitative depth profiles from the first atomic layers down to the bulk (more than 150 microns) with sputtering rates typically 1000 times faster than other surface techniques.
For more information contact Horiba Jobin Yvon
Digital Edition
Lab Asia 31.2 April 2024
April 2024
In This Edition Chromatography Articles - Approaches to troubleshooting an SPE method for the analysis of oligonucleotides (pt i) - High-precision liquid flow processes demand full fluidic c...
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