• Ultra Fast Elemental Depth Profiling with the New GD-Profiler 2

Chromatography

Ultra Fast Elemental Depth Profiling with the New GD-Profiler 2

Having a large variety of applications? Interested in Surface Analysis?
Controlling PCD/CVD, galvanised steels, oxide films etc, or studying corrosion mechanisms? RF Glow Discharge Optical Emission Spectrometry
provides quantitative depth profiles from the first atomic layers down to the bulk (more than 150 microns) with sputtering rates typically 1000 times faster than other surface techniques.
For more information contact Horiba Jobin Yvon


Digital Edition

ILM 50.2 March 2025

March 2025

Chromatography Articles - Effects of small deviations in flow rate on GPC/SEC results Mass Spectrometry & Spectroscopy Articles - Waiting for the present to catch up to the future: A bette...

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