Chromatography
Ultra Fast Elemental Depth Profiling with the New GD-Profiler 2
Apr 10 2008
Controlling PCD/CVD, galvanised steels, oxide films etc, or studying corrosion mechanisms? RF Glow Discharge Optical Emission Spectrometry
provides quantitative depth profiles from the first atomic layers down to the bulk (more than 150 microns) with sputtering rates typically 1000 times faster than other surface techniques.
For more information contact Horiba Jobin Yvon
Digital Edition
ILM 50.2 March 2025
March 2025
Chromatography Articles - Effects of small deviations in flow rate on GPC/SEC results Mass Spectrometry & Spectroscopy Articles - Waiting for the present to catch up to the future: A bette...
View all digital editions
Events
Mar 20 2025 Brussels, Belgium
Mar 20 2025 Chandigarh, India
ACS National Meeting & Expo, Spring 2025
Mar 23 2025 San Diego, CA, USA
Mar 25 2025 Paris, France
Mar 27 2025 New Delhi, India