• New Mass Spectrometer Offering Up to 100x Improved Sensitivity

Chromatography

New Mass Spectrometer Offering Up to 100x Improved Sensitivity

Mar 16 2010

Almsco International announced that it will showcase its new state-of-the-art BenchTOF-dx™ mass spectrometer for the first time at Pittcon 2010. Unlike conventional technology, the new compact reflectron time-of-flight (TOF) instrument is specifically designed to generate truly classical electron impact ionization (EI) spectra for gas chromatography (GC) and comprehensive GCxGC applications.

The BenchTOF-dx enhances the benefits of standard TOF mass spectrometers, making it perfect for historically challenging compounds. The instrument’s breakthrough capability to generate classical spectra
enables laboratories with proprietary spectral libraries to harness the performance benefits of TOF mass spectrometry while maintaining the use of their current library system.

Incorporating new groundbreaking ion optics and electronics the BenchTOF-dx delivers full spectral information at sensitivity normally only associated with the best Quadrupoles running in selected ion monitoring (SIM) mode. The rugged, low-cost, design means frequency of routine mass tuning and calibration are superior to those of standard Quadrupole systems.

BenchTOF-dx is directly compatible with industry-leading GC analytical systems. This platform-neutral instrument has been designed to easily integrate into popular mass spectrometry data analysis platforms and interface with most GC systems. This additional advantage removes the steep learning curve often associated with the implementation of a new mass spectrometry system, enabling immediate productivity improvements.

With a selectable spectral acquisition rate that exceeds 500 spectra per second, there are no GC or GCxGC separations that the system cannot accommodate. The new BenchTOF-dx is accompanied by sophisticated
target search software incorporating deconvolution and chemometric analysis to facilitate rapid screening of known compounds at trace levels.


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