Chromatography
New X-ray Fluorescence Analyzer Features Optional Touch Screen Operation and Higher Spectral Resolution Detector Unit
May 15 2007
Introduced in 2005, the SPECTRO iQ was specifically developed for demanding process control applications. It uses polarized excitation to perform multi-elemental analysis of solid, powder and liquid samples primarily for process control, where rapid analysis, reliable analytical results and simplified operation are especially important.
The latest version of the SPECTRO iQ surpasses its predecessor by being easier to operate and incorporating a new detection system derived from the larger and more powerful SPECTRO XEPOS XRF instrument.
Among the improvements is a new software control interface that allows the addition of an optional touch-screen computer. With the touch screen and the clearly structured menus, it is no problem for non-technical personnel to start, monitor, evaluate and document the analytical processes with only a few commands.
In addition to its innovative control software, the SPECTRO iQ II is equipped with a new Silicon Drift Detector unit that is technically derived from the detector in the larger and more powerful SPECTRO XEPOS XRF spectrometer.
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Lab Asia 31.2 April 2024
April 2024
In This Edition Chromatography Articles - Approaches to troubleshooting an SPE method for the analysis of oligonucleotides (pt i) - High-precision liquid flow processes demand full fluidic c...
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