LS 13 320 SERIES* LASER DIFFRA CTIO N PARTICLE SIZE ANALYSER
- Patented PIDS nanosizing technology with XD Array laser diffraction components help achieve the best-in-class dynamic range.
- Supports 21 CFR Part 11 and meets all global data integrity requirements
- 25% time savings when the instrument prepares for a sample run (clean, align, background, offsets).
- Reduce operator errors and meet FDA requirements with user permissions.
- Seamless historical data matching with Beckman Legacy products and popular laser diffraction products.
More information online: https://ilmt.co/PL/5Qx6