Bruker at Microscience 2010

Bruker occupied a large booth in the centre of the exhibition area at Microscience 2010. Bruker set up a JEOL 6610 scanning electron microscope with electron backscatter diffraction system (EBSD) and energy dispersive

X-ray spectrometer (EDS), which proved very popular with demonstrations. The EBSD system was equipped with a latest generation detector, the e–Flash 1000+ complete with forescattered / backscattered electron detectors. Also exhibited were a N8 NEOS atomic force microscope (AFM) of the new generation and a M4 TORNADO micro X-ray fluorescence (μ-XRF) spectrometer. Visitors were reportedly fascinated by the versatility of the both instruments and the quality of the results.

Bruker held two 45 minute workshops. The first dealt with μ-XRF and EBSD, the second was on EDS, focussing especially on transmission electron microscopy and AFM. Bruker also booked screen advertising at the entrance to the conference area and sponsored coffee cups to make the Bruker logo omnipresent at Microscience 2010 and this was reportedly a smart move.