Mass Spectrometry & Spectroscopy

  • New Bolt-on SIMS/SNMS facility

New Bolt-on SIMS/SNMS facility

Feb 16 2012 Read 1261 Times

Hiden SIMS bolt-on mass spectrometers and ion guns enable a complete SIMS facility to be added to diverse analytical UHV surface analysis facilities, and the latest Hiden EQS probe now offers the inclusion of an integrated SNMS mode to provide the dual roles of sputtered neutral and secondary ion mass spectrometry. The dual techniques are beneficial for the measurement of optical and metallurgical coatings, alloys, corrosion layers and architectural coatings for example, enabling direct quantification of concentration over the full range from trace level to 100%.

The high-transparency electron impact ioniser at the immediate entry region to the probe ensures  efficient ionisation of sputtered neutrals and optimum transmission efficiency for secondary ions. Both SIMS and SNMS can be combined throughout a continuous measurement sequence to provide quantified depth profiling data through the widest concentration range. The full product range includes both gas and metal-sourced ion guns. Both the probe and the ion guns require a chamber mounting port diameter of just 38mm(1.5 inches) diameter.

Reader comments

Do you like or dislike what you have read? Why not post a comment to tell others / the manufacturer and our Editor what you think. To leave comments please complete the form below. Providing the content is approved, your comment will be on screen in less than 24 hours. Leaving comments on product information and articles can assist with future editorial and article content. Post questions, thoughts or simply whether you like the content.

Post a Comment




Digital Edition

International Labmate July 2019

July 2019

In This Edition Mass Spectrometry & Spectroscopy - 67th ASMS Conference on Mass Spectrometry and Allied Topics - Modular MS Bench System with Integrated Gas Supply for Sciex LC-MS/MS Unveile...

View all digital editions

Events

AACC Annual Meeting & Clinical Lab Expo

Aug 04 2019 Anaheim, CA, USA

M&M 2019

Aug 04 2019 Portland, OR, USA

DXC 2019

Aug 05 2019 Lombard, IL, USA

ACS National Meeting & Expo, Fall 2019

Aug 25 2019 San Diego, CA, USA

Microscopy Conference 2019

Sep 01 2019 Berlin, Germany

View all events