• New Bolt-on SIMS/SNMS facility

Mass Spectrometry & Spectroscopy

New Bolt-on SIMS/SNMS facility

Feb 16 2012

Hiden SIMS bolt-on mass spectrometers and ion guns enable a complete SIMS facility to be added to diverse analytical UHV surface analysis facilities, and the latest Hiden EQS probe now offers the inclusion of an integrated SNMS mode to provide the dual roles of sputtered neutral and secondary ion mass spectrometry. The dual techniques are beneficial for the measurement of optical and metallurgical coatings, alloys, corrosion layers and architectural coatings for example, enabling direct quantification of concentration over the full range from trace level to 100%.

The high-transparency electron impact ioniser at the immediate entry region to the probe ensures  efficient ionisation of sputtered neutrals and optimum transmission efficiency for secondary ions. Both SIMS and SNMS can be combined throughout a continuous measurement sequence to provide quantified depth profiling data through the widest concentration range. The full product range includes both gas and metal-sourced ion guns. Both the probe and the ion guns require a chamber mounting port diameter of just 38mm(1.5 inches) diameter.


Digital Edition

Lab Asia 31.2 April 2024

April 2024

In This Edition Chromatography Articles - Approaches to troubleshooting an SPE method for the analysis of oligonucleotides (pt i) - High-precision liquid flow processes demand full fluidic c...

View all digital editions

Events

Microbiology Society Annual Conference 2024

Apr 08 2024 Edinburgh 2024

analytica 2024

Apr 09 2024 Munich, Germany

ChemBio Finland 2024

Apr 10 2024 Helsinki, Finland

Analytica Anacon India & IndiaLabExpo

Apr 15 2024 Mumbai, India

Analitika Expo 2024

Apr 16 2024 Moscow, Russia

View all events