Microscopy & microtechniques
New Multibeam SEM/FIB for Simultaneous Micro Milling and High Resolution SEM Imaging
Jan 30 2008
A versatile all-in-one system, the MultiBeam features Serial Slicing and Sampling (S3TM) for in-process monitoring of milling, fabrication, and reconstructing 3D images of the sectioned area. A maximum milling current of 30 nA ensures high throughput milling of large areas.
Additional features include low vacuum operation for non-conductive specimens without coating or alteration, a gas injection system for etching and deposition, a large stage for up to 150 mm samples, and a multiple port design for a range of analytical needs. Samples are loaded through a standard airlock system.
Two new nano-imaging labs will take delivery of the MultiBeam systems in early 2008. Jeol USA has formed a partnership with both the University of Southern California and Boston College which will advance applications research on the east and west coasts
Digital Edition
Lab Asia 32.1 Feb 2025
February 2025
Chromatography Articles - Comparing volumetric and thermal flowmeters for assessing and validating liquid chromatography performance Mass Spectrometry & Spectroscopy Articles - The importa...
View all digital editions
Events
SPS Smart Production Solutions Guangzhou
Feb 25 2025 Guanghzou, China
Feb 25 2025 Amsterdam, Netherlands
Feb 27 2025 Kathmandu, Nepal
Mar 01 2025 Boston, MA, USA
Mar 02 2025 Bethesda, MD, USA