• State-of-the-art bench-top TOF Mass Spectrometer for Improved Sensitivity


State-of-the-art bench-top TOF Mass Spectrometer for Improved Sensitivity

Aug 19 2011

Almsco International has released its state-of-the-art bench-top time of flight (TOF) mass spectrometer,  BenchTOF-dx™. The instrument is specially designed to generate truly classical electron impact ionisation (EI) spectra for gas chromatography (GC) and comprehensive GC/GC applications. It enables users to screen samples at trace levels, offering optimal sensitivity without comprising speed of analyses and selectivity. Almsco also highlights
its recently launched TargetView™ software designed to automate and improve detection and measurement of multiple target chemicals in complex GC/MS data sets. When combined with Markes International’s market-leading systems for thermal desorption (TD), it provides a total solution for analysing ultra-trace level components in
complex samples.

Laboratories screening samples at trace levels require a method that offers a blend of sensitivity to enable analysts to monitor the entire sample and enough selectivity to enhance confidence in the results. The BenchTOF-dx™ features high definition mass spectrometry (MS) technology and combines speed and resolution with uncompromised
spectral quality even at trace concentrations. While high resolution accurate mass (HRAM) mass spectrometry is ideal for demanding applications such as proteomics, high definition MS is an alternative and cost-effective compound screening technique that is suited to applications such as forensics, food safety testing and environmental
analyses. The novel method enables analysts to screen for both known and unknown compounds at much lower levels with a high degree of definition and clarity. Trace compounds can be clearly identified, quantified and differentiated from one another, while also retaining the required attributes of speed and selectivity.

In addition, the BenchTOF-dx™ has been designed to easily integrate into popular mass spectrometry data analysis platforms and interface with most GC systems. This additional advantage removes the steep learning curve often associated with the implementation of a new mass spectrometry system, enabling immediate productivity improvements.

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